Defect and impurity engineered semiconductors and devices : symposium held April 17-21, 1995, San Francisco, California, U.S.A.
Bibliographic Information
- Title
- "Defect and impurity engineered semiconductors and devices : symposium held April 17-21, 1995, San Francisco, California, U.S.A."
- Statement of Responsibility
- editors, S. Ashok ... [et al.]
- Publisher
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- Materials Research Society
- Publication Year
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- c1995
- Book size
- 24 cm
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Notes
Includes bibliographical references and index
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Details 詳細情報について
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- CRID
- 1130000796639362688
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- NII Book ID
- BA26261717
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- ISBN
- 1558992812
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- LCCN
- 95022910
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- Web Site
- https://lccn.loc.gov/95022910
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- Text Lang
- en
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- Country Code
- us
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- Title Language Code
- en
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- Place of Publication
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- Pittsburgh, PA
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- Classification
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- LCC: TK7871.85
- DC20: 621.3815/2
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- Subject
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- LCSH: Semiconductors
- LCSH: Semiconductors -- Defects
- LCSH: Semiconductors -- Impurity distribution
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- Data Source
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- CiNii Books
