Analog signal generation for built-in-self-test of mixed-signal integrated circuits

Name: Analog signal generation for built-in-self-test of mixed-signal integrated circuits
Author: Roberts, Gordon W., Lu, Albert K.

Web Site CiNii Available at 5 libraries

Bibliographic Information

Title: "Analog signal generation for built-in-self-test of mixed-signal integrated circuits"

Publisher

Publication Year

Includes bibliographical references and index

CRID

1130000796672363264
NII Book ID

BA2486208X
ISBN

0792395646
LCCN

95000989
Web Site

https://lccn.loc.gov/95000989
Text Lang

en
Country Code

us
Title Language Code

en
Place of Publication
- Boston
Classification
- LCC: TK7872.S5
- DC20: 621.3815/48
Subject
- LCSH: Signal generators -- Design and construction
- LCSH: Integrated circuits -- Design and construction
- LCSH: Integrated circuits -- Testing
- LCSH: Signal processing -- Digital techniques
Data Source
- CiNii Books