Measurement technology and its application III : selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China

CiNii Available at 1 libraries

Bibliographic Information

Title
"Measurement technology and its application III : selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China"
Statement of Responsibility
edited by Prasad Yarlagadda and Yun-Hae Kim
Publisher
  • Trans Tech Publications
Publication Year
  • c2014
Book size
24 cm
Series Name / No
  • : [set]

Search this Book/Journal

Notes

Includes bibliographical references and indexes

Related Books

See more

Details 詳細情報について

  • CRID
    1130000796720040960
  • NII Book ID
    BB1710271X
  • ISBN
    9783038351382
  • Text Lang
    en
  • Country Code
    sz
  • Title Language Code
    en
  • Place of Publication
    • Durnten-Zurich
  • Data Source
    • CiNii Books
Back to top