Bibliographic Information
- Title
- "Multi-chip module test strategies"
- Statement of Responsibility
- edited by Yervant Zorian
- Publisher
-
- Kluwer
- Publication Year
-
- c1997
- Book size
- 27 cm
- Series Name / No
-
- acid-free paper
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Notes
"Reprinted from a special issue of Journal of electronic testing: theory and applications, vol. 10, nos. 1 & 2, April 1997."
Includes bibliographical references and index
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Details 詳細情報について
-
- CRID
- 1130000796739332480
-
- NII Book ID
- BA36370107
-
- ISBN
- 079239920X
-
- LCCN
- 97008206
-
- Web Site
- https://lccn.loc.gov/97008206
-
- Text Lang
- en
-
- Country Code
- us
-
- Title Language Code
- en
-
- Place of Publication
-
- Boston
-
- Classification
-
- LCC: TK7874
- DC21: 621.381/046
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- Subject
-
- Data Source
-
- CiNii Books