Electron microfractography : a symposium presented at the seventy-first annual meeting, American Society for Testing and Materials
Bibliographic Information
- Title
- "Electron microfractography : a symposium presented at the seventy-first annual meeting, American Society for Testing and Materials"
- Publisher
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- American Society for Testing and Materials
- Publication Year
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- [1969]
- Book size
- 24 cm
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Notes
"Sponsored by Subcommittee II on Fractography of ASTM Committee E-24 on Fracture Testing of Metals."
Includes bibliographies
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Details 詳細情報について
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- CRID
- 1130000796809934080
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- NII Book ID
- BA02975967
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- ISBN
- 0803100132
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- LCCN
- 76078439
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- Web Site
- https://lccn.loc.gov/76078439
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- Text Lang
- en
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- Country Code
- us
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- Title Language Code
- en
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- Place of Publication
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- Philadelphia
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- Subject
-
- Data Source
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- CiNii Books