Materials, technology and reliability for advanced interconnects and low-k dielectrics - 2004 : symposium held April 13-15, 2004, San Francisco, California, U.S.A.

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Bibliographic Information

Title
"Materials, technology and reliability for advanced interconnects and low-k dielectrics - 2004 : symposium held April 13-15, 2004, San Francisco, California, U.S.A."
Statement of Responsibility
editors, R.J. Carter ... [et al.]
Publisher
  • Materials Research Society
Publication Year
  • c2004
Book size
24 cm

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Notes

Includes bibliographical references and indexes

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Details 詳細情報について

  • CRID
    1130000796931980544
  • NII Book ID
    BA69047763
  • ISBN
    1558997628
  • Text Lang
    en
  • Country Code
    us
  • Title Language Code
    en
  • Place of Publication
    • Warrendale
  • Data Source
    • CiNii Books
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