Advanced measurement and test IV : selected, peer reviewed papers from the 2014 4th International Conference on Advanced Measurement and Test, (AMT 2014), November 1-2, 2014, Wuhan, China

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Bibliographic Information

Title
"Advanced measurement and test IV : selected, peer reviewed papers from the 2014 4th International Conference on Advanced Measurement and Test, (AMT 2014), November 1-2, 2014, Wuhan, China"
Statement of Responsibility
edited by Ankdrew Parvel and Andy Wu
Publisher
  • Trans Tech Publications
Publication Year
  • c2015
Book size
24 cm
Series Name / No
  • : pbk

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Notes

Includes bibliographical references and indexes

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Details 詳細情報について

  • CRID
    1130000796981575040
  • NII Book ID
    BB1875688X
  • ISBN
    9783038353744
  • Text Lang
    en
  • Country Code
    sz
  • Title Language Code
    en
  • Place of Publication
    • Pfaffikon
  • Data Source
    • CiNii Books
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