Semiconductor characterization techniques : proceedings of the Topical Conference on Characterization Techniques for Semiconductor Materials and Devices

Topical Conference on Characterization Techniques for Semiconductor Materials and Devices, Barnes, Peter A., Rozgonyi, George A., Electrochemical Society. Electronics Division

Semiconductor characterization techniques : proceedings of the Topical Conference on Characterization Techniques for Semiconductor Materials and Devices

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書誌事項

タイトル: "Semiconductor characterization techniques : proceedings of the Topical Conference on Characterization Techniques for Semiconductor Materials and Devices"

責任表示: edited by Peter A. Barnes, George A. Rozgonyi, assistant editors, C.L. Anderson ... [et al.]

出版者

Electrochemical Society

出版年月

c1978

書籍サイズ: 23 cm

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注記

Includes bibliographical references and indexes

"... Topical Conference on Characterization Techniques for Semiconductor Materials and Devices, sponsored by the Electronics Division of the Electrochemical Society, which was held May 21-26, 1978 in Seattle, Washington."--Preface

Semiconductor characterization techniques : proceedings of the Topical Conference on Characterization Techniques for Semiconductor Materials and Devices

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Semiconductor characterization techniques : proceedings of the Topical Conference on Characterization Techniques for Semiconductor Materials and Devices

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この図書・雑誌をさがす

注記

関連図書・雑誌

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