Defects in SiO[2] and related dielectrics : science and technology

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Bibliographic Information

Title
"Defects in SiO[2] and related dielectrics : science and technology"
Statement of Responsibility
edited by G. Pacchioni, L. Skuja, D. L. Griscom
Publisher
  • Kluwer Academic Publishers
Publication Year
  • c2000
Book size
25 cm
Series Name / No
  • : pbk

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Notes

Includes bibliographical references and index

"Proceedings of the NATO Advanced Study Institute on Defects in SiO[2] and Related Dielectrics, Science and Technology, Erice, Italy, April 8-20, 2000"--T.P. verso

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