High-speed inspection architectures, barcoding, and character recognition : 5-7 November 1990, Boston, Massachusetts
Bibliographic Information
- Title
- "High-speed inspection architectures, barcoding, and character recognition : 5-7 November 1990, Boston, Massachusetts"
- Statement of Responsibility
- Michael J. Chen, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering
- Publisher
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- SPIE
- Publication Year
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- c1991
- Book size
- 28 cm
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Notes
"Part of a four-conference program on Machine Vision System Integration held at SPIE's Symposium on Advances in Intelligent Systems, a part of OE/Boston '90, 4-9 November 1990, in Boston, Massachusetts"--P. viii
Includes bibliographical references and index
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Details 詳細情報について
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- CRID
- 1130000797421811456
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- NII Book ID
- BA25774534
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- ISBN
- 0819404519
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- LCCN
- 90064017
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- Web Site
- https://lccn.loc.gov/90064017
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- Text Lang
- en
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- Country Code
- us
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- Title Language Code
- en
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- Place of Publication
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- Bellingham, Wash., USA
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- Data Source
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- CiNii Books