Recombination lifetime measurements in silicon

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Bibliographic Information

Title
"Recombination lifetime measurements in silicon"
Statement of Responsibility
Dinesh C. Gupta, Fred R. Bacher, and William H. Hughes, editors
Publisher
  • ASTM
Publication Year
  • c1998
Book size
24 cm

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Notes

Papers presented at the Advanced Workshop on Silicon Recombination Lifetime Characterization Methods, held in Santa Clara, Calif on June 2-3, 1997

Includes bibliographical references and index

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