Bibliographic Information
- Title
- "Recombination lifetime measurements in silicon"
- Statement of Responsibility
- Dinesh C. Gupta, Fred R. Bacher, and William H. Hughes, editors
- Publisher
-
- ASTM
- Publication Year
-
- c1998
- Book size
- 24 cm
Search this Book/Journal
Notes
Papers presented at the Advanced Workshop on Silicon Recombination Lifetime Characterization Methods, held in Santa Clara, Calif on June 2-3, 1997
Includes bibliographical references and index
- Tweet
Details 詳細情報について
-
- CRID
- 1130000797481019648
-
- NII Book ID
- BA38492284
-
- ISBN
- 0803124899
-
- LCCN
- 98022034
-
- Web Site
- https://lccn.loc.gov/98022034
-
- Text Lang
- en
-
- Country Code
- us
-
- Title Language Code
- en
-
- Place of Publication
-
- W. Conshohocken, PA
-
- Classification
-
- LCC: TK7871.852
- DC21: 621.3815/2
-
- Data Source
-
- CiNii Books