Advanced characterization techniques for optics, semiconductors, and nanotechnologies : 3-5 August 2003, San Diego, California, USA
Bibliographic Information
- Title
- "Advanced characterization techniques for optics, semiconductors, and nanotechnologies : 3-5 August 2003, San Diego, California, USA"
- Statement of Responsibility
- Angela Duparré, Bhanwar Singh, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering
- Publisher
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- SPIE
- Publication Year
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- c2003
- Book size
- 28 cm
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Notes
Includes bibliographical references and index
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Details 詳細情報について
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- CRID
- 1130000797518556800
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- NII Book ID
- BA85970530
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- ISBN
- 0819450618
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- LCCN
- 2004298723
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- Web Site
- https://lccn.loc.gov/2004298723
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- Text Lang
- en
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- Country Code
- us
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- Title Language Code
- en
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- Place of Publication
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- Bellingham, Wash., USA
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- Classification
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- LCC: TA1750
- DC22: 621.381/045
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- Data Source
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- CiNii Books