Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices
Bibliographic Information
- Title
- "Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices"
- Statement of Responsibility
- edited by Thomas J. Shaffner, Dieter K. Schroder
- Publisher
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- Electrochemical Society
- Publication Year
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- c1988
- Book size
- 23 cm
- Other Title
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- Diagnostic techniques for semiconductor materials and devices
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Notes
Includes bibliographical references and indexes
Sponsored by: the Electronics and Dielectrics and Insulation Divisions
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Details 詳細情報について
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- CRID
- 1130000797626294272
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- NII Book ID
- BA84976826
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- LCCN
- 88082408
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- Web Site
- https://lccn.loc.gov/88082408
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- Text Lang
- en
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- Country Code
- us
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- Title Language Code
- en
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- Place of Publication
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- Pennington, NJ
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- Classification
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- LCC: TK7871.85
- DC20: 621.381/52
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- Subject
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- Data Source
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- CiNii Books