Performance and reliability of semiconductor devices : symposium held November 30-December 3, 2008, Boston, Massachusetts, U.S.A.

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Bibliographic Information

Title
"Performance and reliability of semiconductor devices : symposium held November 30-December 3, 2008, Boston, Massachusetts, U.S.A."
Statement of Responsibility
editors, Michael Mastro ... [et al.]
Publisher
  • Materials Research Society
Publication Year
  • c2009
Book size
24 cm

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Notes

Includes bibliographical references and indexes

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Details 詳細情報について

  • CRID
    1130000797767609216
  • NII Book ID
    BA90769473
  • ISBN
    9781605110806
  • Text Lang
    en
  • Country Code
    us
  • Title Language Code
    en
  • Place of Publication
    • Warrendale, Pa.
  • Data Source
    • CiNii Books
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