Characterization of defects in materials : symposium held December 1-2, 1986, Boston, Massachusetts, U.S.A.
Bibliographic Information
- Title
- "Characterization of defects in materials : symposium held December 1-2, 1986, Boston, Massachusetts, U.S.A."
- Statement of Responsibility
- editors, Richard W. Siegel, Julia R. Weertman, Robert Sinclair
- Publisher
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- Materials Research Society
- Publication Year
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- c1987
- Book size
- 24 cm
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Notes
Includes bibliographies
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Details 詳細情報について
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- CRID
- 1130000797897363840
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- NII Book ID
- BA01314391
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- ISBN
- 0931837472
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- LCCN
- 87014023
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- Web Site
- https://lccn.loc.gov/87014023
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- Text Lang
- en
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- Country Code
- us
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- Title Language Code
- en
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- Place of Publication
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- Pittsburgh, Pa.
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- Subject
-
- Data Source
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- CiNii Books