Reliability and materials issues of semiconductor optical and electrical devices and materials : symposium held November 29 - December 3, Boston, Massachusetts, U.S.A.
CiNii
Available at 2 libraries
Bibliographic Information
- Title
- "Reliability and materials issues of semiconductor optical and electrical devices and materials : symposium held November 29 - December 3, Boston, Massachusetts, U.S.A."
- Statement of Responsibility
- editors, Osamu Ueda ... [et al.]
- Publisher
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- Materials Research Society
- Publication Year
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- c2010
- Book size
- 24 cm
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Notes
"Symposium B, 'Reliability and Materials Issues of Semiconductor Optical and Electrical Devices,' was held November 30-December 3 at the 2009 MRS Fall Meeting in Boston, Massachusetts."--Pref
"Fall 2009."--Spine
Includes bibliographical references and indexes
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Details 詳細情報について
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- CRID
- 1130000797951529984
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- NII Book ID
- BB06275669
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- ISBN
- 9781605111681
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- Text Lang
- en
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- Country Code
- us
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- Title Language Code
- en
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- Place of Publication
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- Warrendale, Pa.
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- Classification
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- LCC: TA401
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- Data Source
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- CiNii Books