An introduction to time-of-flight secondary ion mass spectrometry (ToF-SIMS) and its application to materials science

CiNii Available at 3 libraries

Bibliographic Information

Title
"An introduction to time-of-flight secondary ion mass spectrometry (ToF-SIMS) and its application to materials science"
Statement of Responsibility
Sarah Fearn
Publisher
  • Morgan & Claypool
Publication Year
  • c2015
Book size
26 cm
Series Name / No
  • : print

Search this Book/Journal

Notes

"A Morgan & Claypool publication as part of IOP Concise Physics"--T.p. verso

"IOP ebooks"--Cover

Includes bibliographical references

Related Books

See more

Details 詳細情報について

  • CRID
    1130000798045000704
  • NII Book ID
    BB22394374
  • ISBN
    9781681740249
  • Text Lang
    en
  • Country Code
    us
  • Title Language Code
    en
  • Place of Publication
    • San Rafael, Calif.
  • Data Source
    • CiNii Books
Back to top