Emerging nanotechnologies : test, defect tolerance, and reliability
Bibliographic Information
- Title
- "Emerging nanotechnologies : test, defect tolerance, and reliability"
- Statement of Responsibility
- Mohammad Tehranipoor, editor
- Publisher
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- Springer
- Publication Year
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- c2008
- Book size
- 25 cm
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Notes
Includes bibliographical references and index
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Details 詳細情報について
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- CRID
- 1130000798138095232
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- NII Book ID
- BA88633446
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- ISBN
- 9780387747460
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- LCCN
- 2007933699
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- Web Site
- https://lccn.loc.gov/2007933699
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- Text Lang
- en
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- Country Code
- us
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- Title Language Code
- en
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- Place of Publication
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- New York
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- Classification
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- LCC: T174.7
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- Subject
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- LCSH: Nanotechnology
- LCSH: Microtechnology
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- Data Source
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- CiNii Books