Derivation of optimum tests to detect faults in combinational circuits

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Bibliographic Information

Title
"Derivation of optimum tests to detect faults in combinational circuits"
Statement of Responsibility
J.F. Poage
Publisher
  • Princeton University
Publication Year
  • 1962
Book size
28 cm

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Notes

"March 1962"

"This work was performed while the author held a Bell Telephone Laboratories Employee Fellowship at Princeton University"

Includes bibliographical references (p. 38-39)

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Details 詳細情報について

  • CRID
    1130000798214595200
  • NII Book ID
    BA86699068
  • Text Lang
    en
  • Country Code
    us
  • Title Language Code
    en
  • Place of Publication
    • [Princeton]
  • Data Source
    • CiNii Books
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