Polarization analysis and applications to device technology : International Symposium on Polarization Analysis and Applications to Device Technology : 12-14 June, 1996, Yokahama, Japan

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Bibliographic Information

Title
"Polarization analysis and applications to device technology : International Symposium on Polarization Analysis and Applications to Device Technology : 12-14 June, 1996, Yokahama, Japan"
Statement of Responsibility
Toru Yoshizawa, Hideshi Yokota, editors ; sponsored by SPIE Japan Chapter ... [et al.] ; published by SPIE--The International Society for Optical Engineering
Publisher
  • SPIE
Publication Year
  • c1996
Book size
28 cm

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Notes

Includes bibliographical references and index

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