Atomic force microscopy for energy research
Bibliographic Information
- Title
- "Atomic force microscopy for energy research"
- Statement of Responsibility
- edited by Cai Shen
- Publisher
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- CRC Press
- Publication Year
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- 2022
- Book size
- 25 cm
- Series Name / No
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- : hbk
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Notes
Includes bibliographical references and index
Summary: "Atomic force microscopy (AFM) can be used to analyze and measure the physical properties of all kinds of materials at nanoscale in the atmosphere, liquid phase, and ultra-high vacuum environment. It has become an important tool for nanoscience research. In this book, the basic principles of functional AFM techniques and their applications in energy materials such as lithium batteries, electrochemical catalysis, solar cells, and other energy-related materials are addressed. With its substantial content and logical structure, Atomic Force Microscopy for Energy Research is a valuable reference for researchers in materials science, chemistry, and physics working with AFM or planning to use it in their own fields of research, especially energy research"-- Provided by publisher
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Details 詳細情報について
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- CRID
- 1130011528813134208
-
- NII Book ID
- BC16067687
-
- ISBN
- 9781032004075
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- Text Lang
- en
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- Country Code
- us
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- Title Language Code
- en
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- Place of Publication
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- Boca Raton, FL
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- Subject
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- LCSH: Atomic force microscopy
- LCSH: Power resources -- Research
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- Data Source
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- CiNii Books
