Thin film materials, processes, and reliability : proceedings of the international symposium

Mathad, G. S., Engelhardt, M. (Michael), Electrochemical Society. Dielectric Science and Technology Division, Electrochemical Society. Electronics Division, Electrochemical Society. Electrodeposition Division, Electrochemical Society. Meeting, International Society of Electrochemistry. Meeting

Thin film materials, processes, and reliability : proceedings of the international symposium

Web Site CiNii 所蔵館 1館

書誌事項

タイトル: "Thin film materials, processes, and reliability : proceedings of the international symposium"

責任表示: editor, G.S. Mathad ; assistant editors, M. Engelhardt ...[et al.]

出版者

Electrochemical Society

出版年月

c2001

書籍サイズ: 24 cm

この図書・雑誌をさがす

注記

"These symposia, jointly sponsored by Dielectric Science & Technology, Electronics, and Electrodeposition dicisions, were held as part of the 2001 Joint International Meeting -the 200th Meeting of The Electrochemical Society, Inc. and the 52nd Annual Meeting of the International Society of Electrochemistry, in San Francisco, CA, September 2-7, 2001" --on pref

Includes bibliographical references and indexes

Thin film materials, processes, and reliability : proceedings of the international symposium

書誌事項

この図書・雑誌をさがす

注記

関連図書・雑誌

詳細情報詳細情報について

書き出し

Thin film materials, processes, and reliability : proceedings of the international symposium

書誌事項

この図書・雑誌をさがす

注記

関連図書・雑誌

詳細情報 詳細情報について

書き出し

詳細情報詳細情報について