Transient capacitance measurements of deep level defects introduced in γ-ray compensated germanium by long-term annealing at room temperature

CiNii Available at 1 libraries

Bibliographic Information

Title
"Transient capacitance measurements of deep level defects introduced in γ-ray compensated germanium by long-term annealing at room temperature"
Statement of Responsibility
by S. J. Pearton...[et al.]
Publisher
  • Australian Atomic Energy Commission, Research Establishment
Publication Year
  • 1980.9
Book size
30 cm

Search this Book/Journal

Related Books

See more

Details 詳細情報について

  • CRID
    1130282268721603200
  • NII Book ID
    BA32549367
  • ISBN
    0642596980
  • Text Lang
    en
  • Country Code
    at
  • Title Language Code
    en
  • Place of Publication
    • Lucas Heights
  • Data Source
    • CiNii Books
Back to top