Materials reliability in microelectronics VIII : symposium held April 13-16, 1998, San Francisco, California, U.S.A.
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Bibliographic Information
- Title
- "Materials reliability in microelectronics VIII : symposium held April 13-16, 1998, San Francisco, California, U.S.A."
- Statement of Responsibility
- editors, John C. Bravman ... [et al.]
- Publisher
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- Materials Research Society
- Publication Year
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- c1998
- Book size
- 24 cm
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Notes
Includes index
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Details 詳細情報について
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- CRID
- 1130282268752563712
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- NII Book ID
- BA38805823
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- ISBN
- 155899422X
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- Text Lang
- en
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- Country Code
- us
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- Title Language Code
- en
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- Place of Publication
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- Pittsburgh, Pa.
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- Data Source
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- CiNii Books