Semiconductor measurement technology : spreading resistance symposium : proceedings of a symposium, held at the National Bureau of Standards, Gaithersburg, Md., June 13-14, 1974

HathiTrust 1974 Web Site CiNii Available at 3 libraries

Bibliographic Information

Title
"Semiconductor measurement technology : spreading resistance symposium : proceedings of a symposium, held at the National Bureau of Standards, Gaithersburg, Md., June 13-14, 1974"
Statement of Responsibility
James R. Ehrstein, editor
Publisher
  • U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.
Publication Year
  • 1974
Book size
27 cm
Volume(Year)
  • 400-10
Other Title
  • Spreading resistance symposium

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Notes

"Under the sponsorship of Committee F-1 of the American Society for Testing and Materials and the National Bureau of Standards."

Bibliography: p. 279-281

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