Semiconductor measurement technology : spreading resistance symposium : proceedings of a symposium, held at the National Bureau of Standards, Gaithersburg, Md., June 13-14, 1974
Bibliographic Information
- Title
- "Semiconductor measurement technology : spreading resistance symposium : proceedings of a symposium, held at the National Bureau of Standards, Gaithersburg, Md., June 13-14, 1974"
- Statement of Responsibility
- James R. Ehrstein, editor
- Publisher
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- U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.
- Publication Year
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- 1974
- Book size
- 27 cm
- Volume(Year)
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- 400-10
- Other Title
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- Spreading resistance symposium
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Notes
"Under the sponsorship of Committee F-1 of the American Society for Testing and Materials and the National Bureau of Standards."
Bibliography: p. 279-281
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Details 詳細情報について
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- CRID
- 1130282268957476992
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- NII Book ID
- BA20527833
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- LCCN
- 75600857
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- Text Lang
- en
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- Country Code
- us
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- Title Language Code
- en
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- Place of Publication
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- Washington
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- Classification
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- LCC: QC100
- LCC: TK7871.85
- DC: 389/.08 s
- DC: 621.3815/2/028
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- Subject
-
- Data Source
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- CiNii Books