VLSI test principles and architectures : design for testability

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Bibliographic Information

Title
"VLSI test principles and architectures : design for testability"
Statement of Responsibility
edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen
Publisher
  • Elsevier Morgan Kaufmann Publishers
Publication Year
  • 2006
Book size
24 cm

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Notes

Includes bibliographical references and index

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