Advanced measurement and test : selected, peer reviewed papers from the 2011 2nd International Conference on Advanced Measurement and Test (AMT 2011), June 24-26, 2011, Nanchang, China

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Bibliographic Information

Title
"Advanced measurement and test : selected, peer reviewed papers from the 2011 2nd International Conference on Advanced Measurement and Test (AMT 2011), June 24-26, 2011, Nanchang, China"
Statement of Responsibility
edited by Riza Esa and Yanwen Wu
Publisher
  • Trans Tech Publications
Publication Year
  • c2011
Book size
25 cm
Series Name / No
  • : [set]

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Notes

Includes bibliographical references and indexes

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Details 詳細情報について

  • CRID
    1130282269132887296
  • NII Book ID
    BB07198494
  • ISBN
    9783037851975
  • Text Lang
    en
  • Country Code
    sz
  • Title Language Code
    en
  • Place of Publication
    • Durnten-Zurich
  • Data Source
    • CiNii Books
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