Recent advances in metrology, characterization, and standards for optical digital data disks : 21-22 July 1999, Denver, Colorado
Bibliographic Information
- Title
- "Recent advances in metrology, characterization, and standards for optical digital data disks : 21-22 July 1999, Denver, Colorado"
- Statement of Responsibility
- [Fernando Luis Podio, chair/editor] ; sponsored by SPIE--the International Society for Optical Engineering, IDEMA, [and] Information Technology Lab./National Institute of Standards and Technology
- Publisher
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- SPIE
- Publication Year
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- c1999
- Book size
- 28 cm
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Notes
Includes bibliographical references and index
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Details 詳細情報について
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- CRID
- 1130282269545554048
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- NII Book ID
- BA60519397
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- ISBN
- 081943292X
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- LCCN
- 00698331
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- Web Site
- https://lccn.loc.gov/00698331
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- Text Lang
- en
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- Country Code
- us
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- Title Language Code
- en
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- Place of Publication
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- Bellingham, Wash.
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- Classification
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- LCC: TA1635
- DC21: 621.39/767
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- Data Source
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- CiNii Books