Recent advances in metrology, characterization, and standards for optical digital data disks : 21-22 July 1999, Denver, Colorado

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Bibliographic Information

Title
"Recent advances in metrology, characterization, and standards for optical digital data disks : 21-22 July 1999, Denver, Colorado"
Statement of Responsibility
[Fernando Luis Podio, chair/editor] ; sponsored by SPIE--the International Society for Optical Engineering, IDEMA, [and] Information Technology Lab./National Institute of Standards and Technology
Publisher
  • SPIE
Publication Year
  • c1999
Book size
28 cm

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Notes

Includes bibliographical references and index

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