2nd European Congress on Optics Applied to Metrology (METROP) : presented as part of the Optics, Photonics, and Iconics Engineering Meeting (OPIEM), November 26-30, 1979, Strasbourg, France

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Bibliographic Information

Title
"2nd European Congress on Optics Applied to Metrology (METROP) : presented as part of the Optics, Photonics, and Iconics Engineering Meeting (OPIEM), November 26-30, 1979, Strasbourg, France"
Statement of Responsibility
editors, Michel Grosmann, Patrick Meyrueis ; organized by European Photonics Association in collaboration with the Society of Photo-optical Instrumentation Engineers
Publisher
  • Society of Photo-optical Instrumentation Engineers
Publication Year
  • c1980
Book size
28 cm

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Notes

Includes bibliographical references and indexes

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