ICDS-23 : proceedings of the 23rd International Conference on Defects in Semiconductors, held in Awaji Island, Japan, 24-29 July 2005

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Bibliographic Information

Title
"ICDS-23 : proceedings of the 23rd International Conference on Defects in Semiconductors, held in Awaji Island, Japan, 24-29 July 2005"
Statement of Responsibility
guest editors, A. Oshiyama...[et al.]
Publisher
  • Elsevier
Publication Year
  • c2006
Book size
28 cm

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Details 詳細情報について

  • CRID
    1130282269783775872
  • NII Book ID
    BB25714507
  • Text Lang
    en
  • Country Code
    ne
  • Title Language Code
    en
  • Place of Publication
    • [Amsterdam], The Netherlands
  • Data Source
    • CiNii Books
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