Fatigue crack growth under spectrum loads : a symposium presented at the Seventy-eighth Annual Meeting, American Society for Testing and Materials, Montreal, Canada, 23-24 June, 1975, R. P. Wei and R. I. Stephens, symposium cochairmen
書誌事項
- タイトル
- "Fatigue crack growth under spectrum loads : a symposium presented at the Seventy-eighth Annual Meeting, American Society for Testing and Materials, Montreal, Canada, 23-24 June, 1975, R. P. Wei and R. I. Stephens, symposium cochairmen"
- 出版者
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- ASTM
- 出版年月
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- 1976
- 書籍サイズ
- 24 cm
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注記
Sponsored by the Committee E-24 on Fracture Testing of Metals and Committee E-9 on Fatigue
Includes bibliographical references
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詳細情報 詳細情報について
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- CRID
- 1130282269833554560
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- NII書誌ID
- BA0428111X
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- LCCN
- 75032902
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- Web Site
- https://lccn.loc.gov/75032902
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- 本文言語コード
- en
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- 出版国コード
- us
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- タイトル言語コード
- en
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- 出版地
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- Philadelphia
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- 件名
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- データソース種別
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- CiNii Books