Advanced measurement and test III : selected, peer reviewed papers from the 2013 3rd International Conference on Advanced Measurement and Test (AMT 2013), Xiamen, China, 13-14 March 2013

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Bibliographic Information

Title
"Advanced measurement and test III : selected, peer reviewed papers from the 2013 3rd International Conference on Advanced Measurement and Test (AMT 2013), Xiamen, China, 13-14 March 2013"
Statement of Responsibility
editors, Andy Wu
Publisher
  • Trans Tech Publications
  • Printed from e-media with permission by Curran Associates
Publication Year
  • 2013
Book size
27 cm
Series Name / No
  • : [set]

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Notes

Includes bibliographical references and indexes

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Details 詳細情報について

  • CRID
    1130282269971664768
  • NII Book ID
    BB13871960
  • ISBN
    9781627489324
  • Text Lang
    en
  • Country Code
    sz
  • Title Language Code
    en
  • Place of Publication
    • Stafa-Zuerich
    • Red Hook, NY
  • Data Source
    • CiNii Books
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