Microelectronics manufacturability, yield, and reliability : 20-21 October 1994, Austin, Texas
Bibliographic Information
- Title
- "Microelectronics manufacturability, yield, and reliability : 20-21 October 1994, Austin, Texas"
- Statement of Responsibility
- Barbara Vasquez, Hisao Kawasaki, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering
- Publisher
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- SPIE
- Publication Year
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- c1994
- Book size
- 28 cm
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Notes
Includes bibliographical references and index
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Details 詳細情報について
-
- CRID
- 1130282270022680192
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- NII Book ID
- BA29176079
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- ISBN
- 0819416673
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- LCCN
- 94067260
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- Web Site
- https://lccn.loc.gov/94067260
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- Text Lang
- en
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- Country Code
- us
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- Title Language Code
- en
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- Place of Publication
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- Bellingham, Wash., USA
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- Classification
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- LCC: TK7874
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- Data Source
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- CiNii Books