Analytical and diagnostic techniques for semiconductor materials, devices and processes : joint proceedings of the symposia on ALTECH 99, satellite symposium to ESSDERC 99, Leuven, Belgium [and] the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices

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Bibliographic Information

Title
"Analytical and diagnostic techniques for semiconductor materials, devices and processes : joint proceedings of the symposia on ALTECH 99, satellite symposium to ESSDERC 99, Leuven, Belgium [and] the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices"
Statement of Responsibility
editors, Bernd O. Kolbesen ... [et al.]. ; sponsored by the Electrochemical Society, Inc., Electronics Division
Publisher
  • Electrochemical Society
Publication Year
  • c1999
Book size
24 cm
Series Name / No
  • :ECS
  • :SPIE

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Notes

ALTECH 99 was held Sept. 16-17, 1999, jointly with ESSDERC 99, the 29th European Solid State Device Research Conference, and the ECS Symposium on Diagnostic Techniques for Semiconductor Materials and Devices was held as part of the 1999 Joint International Meeting, 196th Meeting of the Electrochemical Society and the 1999 Fall Meeting of the Electrochemical Society of Japan, Honolulu, Hawaii, Oct. 17-22

"Published in cooperation with the International Society for Optical Engineering."

Includes bibliographical references and indexes

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