Microelectronic test patterns : an overview

HathiTrust 1974 Web Site CiNii Available at 1 libraries

Bibliographic Information

Title
"Microelectronic test patterns : an overview"
Statement of Responsibility
Martin G. Buehler
Publisher
  • U.S. G.P.O.
Publication Year
  • 1974
Book size
27 cm
Volume(Year)
  • 400-6

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Notes

References: p. 11

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