Microelectronic test patterns : an overview
Bibliographic Information
- Title
- "Microelectronic test patterns : an overview"
- Statement of Responsibility
- Martin G. Buehler
- Publisher
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- U.S. G.P.O.
- Publication Year
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- 1974
- Book size
- 27 cm
- Volume(Year)
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- 400-6
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Notes
References: p. 11
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Details 詳細情報について
-
- CRID
- 1130282270305526784
-
- NII Book ID
- BB18570666
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- LCCN
- 74013001
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- Text Lang
- en
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- Country Code
- us
-
- Title Language Code
- en
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- Place of Publication
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- Washington
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- Classification
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- LCC: QC100
- LCC: TK7874
- DC: 389/.08 s
- DC: 621.381/73
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- Subject
-
- Data Source
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- CiNii Books