Bibliographic Information
- Title
- "Yield simulation for integrated circuits"
- Statement of Responsibility
- by Duncan Moore Henry Walker
- Publisher
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- Kluwer Academic Publishers
- Publication Year
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- c1987
- Book size
- 25 cm
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Notes
Based on author's thesis (Ph. D.)
Includes bibliographical references and index
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Details 詳細情報について
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- CRID
- 1130282270891915904
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- NII Book ID
- BA07139931
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- ISBN
- 0898382440
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- LCCN
- 87017302
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- Web Site
- https://lccn.loc.gov/87017302
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- Text Lang
- en
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- Country Code
- us
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- Title Language Code
- en
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- Place of Publication
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- Boston
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- Classification
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- LCC: TK7874
- DC19: 621.381/73
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- Subject
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- LCSH: Integrated circuits -- Very large scale integration -- Design and construction -- Mathematical models
- LCSH: Integrated circuits -- Very large scale integration -- Design and construction -- Data processing
- LCSH: Integrated circuits -- Very large scale integration -- Defects -- Mathematical models
- LCSH: Integrated circuits -- Very large scale integration -- Defects -- Data processing
- LCSH: Monte Carlo method
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- Data Source
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- CiNii Books