Reliability and materials issues of III-V and II-VI semiconductor optical and electron devices and materials II : symposium held April 9-13, 2012, San Francisco, California, U.S.A.

Ueda, Osamu, Materials Research Society, Materials Research Society. Spring Meeting, Reliability and Materials Issues of II-VI and III-V Semiconductor Optical and Electron Devices and Materials

Reliability and materials issues of III-V and II-VI semiconductor optical and electron devices and materials II : symposium held April 9-13, 2012, San Francisco, California, U.S.A.

CiNii 所蔵館 1館

書誌事項

タイトル: "Reliability and materials issues of III-V and II-VI semiconductor optical and electron devices and materials II : symposium held April 9-13, 2012, San Francisco, California, U.S.A."

責任表示: editors, Osamu Ueda ... [et al.]

出版者

Materials Research Society
Cambridge University Press

出版年月

2012

書籍サイズ: 24 cm

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注記

"Symposium G, 'Reliability and Materials Issues of II-VI and III-V Semiconductor Optical and Electron Devices and Materials II', was held April 9-13 at the 2012 MRS Spring Meeting in San Francisco, California."--Pref

Includes bibliographical references and indexes

Reliability and materials issues of III-V and II-VI semiconductor optical and electron devices and materials II : symposium held April 9-13, 2012, San Francisco, California, U.S.A.

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書き出し

Reliability and materials issues of III-V and II-VI semiconductor optical and electron devices and materials II : symposium held April 9-13, 2012, San Francisco, California, U.S.A.

書誌事項

この図書・雑誌をさがす

注記

関連図書・雑誌

詳細情報 詳細情報について

書き出し

詳細情報詳細情報について