Integrated circuit defect-sensitivity : theory and computational models

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Bibliographic Information

Title
"Integrated circuit defect-sensitivity : theory and computational models"
Statement of Responsibility
by José Pineda de Gyvez
Publisher
  • Kluwer Academic Publishers
Publication Year
  • c1993
Book size
25 cm

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Notes

Includes bibliographical references (p. 138-146) and index

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