Defects in PN junctions and MOS capacitors observed using thermally stimulated current and capacitance measurements, videotape script

HathiTrust 1976 Web Site CiNii Available at 1 libraries

Bibliographic Information

Title
"Defects in PN junctions and MOS capacitors observed using thermally stimulated current and capacitance measurements, videotape script"
Statement of Responsibility
Martin G. Buehler
Publisher
  • U.S. G.P.O.
Publication Year
  • 1976
Book size
26 cm
Volume(Year)
  • 400-26

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Notes

Bibliography: p. 14

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