Machine vision and three-dimensional imaging systems for inspection and metrology : 6-8 November 2001 [i.e. 2000], Boston, USA
Bibliographic Information
- Title
- "Machine vision and three-dimensional imaging systems for inspection and metrology : 6-8 November 2001 [i.e. 2000], Boston, USA"
- Statement of Responsibility
- Kevin G. Harding, John W.V. Miller, Bruce G. Batchelor, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering
- Publisher
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- SPIE
- Publication Year
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- c2001
- Book size
- 28 cm
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Notes
Includes bibliographical references and index
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Details 詳細情報について
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- CRID
- 1130282271606151936
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- NII Book ID
- BA60719308
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- ISBN
- 0819438545
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- LCCN
- 2001270560
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- Web Site
- https://lccn.loc.gov/2001270560
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- Text Lang
- en
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- Country Code
- us
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- Title Language Code
- en
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- Place of Publication
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- Bellingham, Wash.
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- Classification
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- LCC: TA1634
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- Data Source
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- CiNii Books