Analytical and diagnostic techniques for semiconductor materials, devices and processes 7
CiNii
Available at 1 libraries
Bibliographic Information
- Title
- "Analytical and diagnostic techniques for semiconductor materials, devices and processes 7"
- Statement of Responsibility
- editors, D. K. Schroder ... [et al.]. ; sponsoring divisions, Electronics and Photonics, Dielectric Science & Technology
- Publisher
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- Electrochemical Society
- Publication Year
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- c2007
- Book size
- 23 cm
- Series Name / No
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- : CD-ROM
- Other Title
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- Analytical Techniques for Semiconductor Materials and Process Characterization
- ALTECH
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Notes
"... was part of the Fall 2007 Electrochemical Society Meeting in Washington, DC, held on October 7-12, 2007."--on pref
"... also contains a CD-ROM with the papers of the ALTECH 07 symposium Analytical Techniques for Semiconductor Materials and Process Characterization V, held as part of the Solid State Device Research Conference (ESSDERC) 2007 in Munich, Germany on September 13-14, 2007."--on pref
Includes bibliographical references and indexes
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Details 詳細情報について
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- CRID
- 1130282271894880896
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- NII Book ID
- BA84582092
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- ISBN
- 9781566775694
- 9781566775793
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- Text Lang
- en
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- Country Code
- us
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- Title Language Code
- en
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- Place of Publication
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- Pennington, N.J.
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- Classification
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- LCC: QD139.S44
- DC21: 621.3815/2
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- Subject
-
- Data Source
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- CiNii Books