Testing, packaging, reliability, and applications of semiconductor lasers IV : 28 January 1999, San Jose, California
Bibliographic Information
- Title
- "Testing, packaging, reliability, and applications of semiconductor lasers IV : 28 January 1999, San Jose, California"
- Statement of Responsibility
- Mahmoud Fallahi, Kurt J. Linden, S.C. Wang
- Publisher
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- SPIE
- Publication Year
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- c1999
- Book size
- 28 cm
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Notes
Includes bibliographical references and index
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Details 詳細情報について
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- CRID
- 1130282272007143040
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- NII Book ID
- BA60548136
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- ISBN
- 081943096X
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- LCCN
- 00500663
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- Web Site
- https://lccn.loc.gov/00500663
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- Text Lang
- en
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- Country Code
- us
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- Title Language Code
- en
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- Place of Publication
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- Bellingham, Wash.
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- Subject
-
- Data Source
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- CiNii Books