Advanced characterization techniques for optical, semiconductor, and data storage components : 9-11 July 2002 Seattle, Washington, USA

CiNii Available at 2 libraries

Bibliographic Information

Title
"Advanced characterization techniques for optical, semiconductor, and data storage components : 9-11 July 2002 Seattle, Washington, USA"
Statement of Responsibility
Angela Duparré, Bhanwar Singh, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations the Boeing Company (USA) ... [et al.]
Publisher
  • SPIE
Publication Year
  • c2002
Book size
28 cm

Search this Book/Journal

Notes

Includes index

Related Books

See more

Details 詳細情報について

  • CRID
    1130282272095313024
  • NII Book ID
    BA80159283
  • ISBN
    0819445460
  • Text Lang
    en
  • Country Code
    us
  • Title Language Code
    en
  • Place of Publication
    • Bellingham, Wash.
  • Data Source
    • CiNii Books
Back to top