Electron beam ion sources and traps and their applications : eighth international symposium EBIS/T 2000, Upton, N.Y. 5-8 November 2000

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Bibliographic Information

Title
"Electron beam ion sources and traps and their applications : eighth international symposium EBIS/T 2000, Upton, N.Y. 5-8 November 2000"
Statement of Responsibility
editor, Krsto Prelec
Publisher
  • American Institute of Physics
Publication Year
  • c2001
Book size
25 cm

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Notes

Includes bibliographical references

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Details 詳細情報について

  • CRID
    1130282272298114176
  • NII Book ID
    BA53573519
  • ISBN
    0735400113
  • LCCN
    01091142
  • Web Site
    https://lccn.loc.gov/01091142
  • Text Lang
    en
  • Country Code
    us
  • Title Language Code
    en
  • Place of Publication
    • Melville, New York
  • Data Source
    • CiNii Books
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