Scanning probe techniques for materials characterization at nanometer scale : proceedings of the International Symposium

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Bibliographic Information

Title
"Scanning probe techniques for materials characterization at nanometer scale : proceedings of the International Symposium"
Statement of Responsibility
editors, D.C. Hansen, H.S. Issacs, K. Sieradzki
Publisher
  • Electrochemical Society
Publication Year
  • c2001
Book size
24 cm

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Notes

"Corrosion, Electrodeposition and Physical Electrochemistry Divisions"--on T.p

Includes bibliographical references and indexes

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Details 詳細情報について

  • CRID
    1130282272373390336
  • NII Book ID
    BA54496592
  • ISBN
    1566773024
  • LCCN
    01086650
  • Web Site
    https://lccn.loc.gov/01086650
  • Text Lang
    en
  • Country Code
    us
  • Title Language Code
    en
  • Place of Publication
    • Pennington, N.J.
  • Data Source
    • CiNii Books
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