Defects and impurities in silicon materials : an introduction to atomic-level silicon engineering

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Bibliographic Information

Title
"Defects and impurities in silicon materials : an introduction to atomic-level silicon engineering"
Statement of Responsibility
Yutaka Yoshida, Guido Langouche, editors
Publisher
  • Springer
Publication Year
  • c2015
Book size
24 cm
Series Name / No
  • : pbk

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Notes

Includes bibliographical references

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Details 詳細情報について

  • CRID
    1130282272611344768
  • NII Book ID
    BB21026400
  • ISBN
    9784431557999
  • LCCN
    2016930107
  • Web Site
    https://lccn.loc.gov/2016930107
  • Text Lang
    en
  • Country Code
    ja
  • Title Language Code
    en
  • Place of Publication
    • Tokyo
  • Classification
  • Subject
  • Data Source
    • CiNii Books
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