Materials, processes, and reliability for advanced interconnects for micro- and nanoelectronics--2011 : symposium held April 25-29, 2011, San Francisco, California, U.S.A.

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Bibliographic Information

Title
"Materials, processes, and reliability for advanced interconnects for micro- and nanoelectronics--2011 : symposium held April 25-29, 2011, San Francisco, California, U.S.A."
Statement of Responsibility
editors, Mikhail R. Baklanov ... [et al.]
Publisher
  • Materials Research Society
  • Cambridge University Press
Publication Year
  • 2012
Book size
24 cm
Series Name / No
  • : hard

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Notes

"Symposium O, 'Materials, Processes, and Reliability for Advanced Interconnects for Micro- and Nanoelectronics', held at the April 25-29, 2011 MRS Spring Meeting in San Francisco, California"--P. ix

Includes bibliographical references and indexes

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Details 詳細情報について

  • CRID
    1130282272713890432
  • NII Book ID
    BB08538361
  • ISBN
    9781605113128
  • LCCN
    2011276248
  • Web Site
    https://lccn.loc.gov/2011276248
  • Text Lang
    en
  • Country Code
    us
  • Title Language Code
    en
  • Place of Publication
    • Warrendale, Pa.
    • Cambridge ; New York
  • Classification
  • Data Source
    • CiNii Books
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