Design, analysis and test of logic circuits under uncertainty

CiNii Available at 1 libraries

Bibliographic Information

Title
"Design, analysis and test of logic circuits under uncertainty"
Statement of Responsibility
Smita Krishnaswamy, Igor L. Markov, John P. Hayes
Publisher
  • Springer
Publication Year
  • c2013
Book size
25 cm
Series Name / No
  • hbk.

Search this Book/Journal

Notes

Includes bibliographical references and index

Related Books

See more

Details 詳細情報について

  • CRID
    1130282273110514816
  • NII Book ID
    BB11880585
  • ISBN
    9789048196432
  • Text Lang
    en
  • Country Code
    ne
  • Title Language Code
    en
  • Place of Publication
    • Dordrecht
  • Data Source
    • CiNii Books
Back to top