Spreading resistance analysis for silicon layers with nonuniform resistivity

Name: Spreading resistance analysis for silicon layers with nonuniform resistivity
Author: Dickey, David H., Ehrstein, James R.

HathiTrust 1979 HathiTrust 1979 Web Site CiNii Available at 1 libraries

Bibliographic Information

Title: "Spreading resistance analysis for silicon layers with nonuniform resistivity"

Publisher

Publication Year

CRID

1130282273168776064
NII Book ID

BB18855531
LCCN

79607012
Web Site

https://lccn.loc.gov/79607012

https://catalog.hathitrust.org/Record/102830550

https://catalog.hathitrust.org/Record/006865785
Text Lang

en
Country Code

us
Title Language Code

en
Place of Publication
- Washington
Classification
- LCC: QC100
- LCC: TK7871.85
- DC: 602/.1 s
- DC: 621.3815/2/028
Subject
- LCSH: Semiconductors -- Testing
- LCSH: Electric resistance, Spreading
- LCSH: Silicon -- Electric properties
Data Source
- CiNii Books

Back to top