Microwave diagnostics of semiconductors : proceedings of the International Symposium on Microwave Diagnostics of Semiconductors, Porvoo, Finland July 13-15, 1977

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Bibliographic Information

Title
"Microwave diagnostics of semiconductors : proceedings of the International Symposium on Microwave Diagnostics of Semiconductors, Porvoo, Finland July 13-15, 1977"
Statement of Responsibility
edited by R. Paananen
Publisher
  • Svenska Tekniska Vetenskapsakademien i Finland
  • Centraltryckeriet
Publication Year
  • 1977
Book size
22 cm

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Notes

At head of title: Svenska Tekniska Vetenskapsakademien i Finland = The Swedish Academy of Engineering Sciencies in Finland

Includes bibliographical references

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Details 詳細情報について

  • CRID
    1130282273286235392
  • NII Book ID
    BB14644738
  • ISBN
    9519090096
  • Text Lang
    en
  • Country Code
    fi
  • Title Language Code
    en
  • Place of Publication
    • Helsingfors
    • Helsingfors
  • Data Source
    • CiNii Books
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